Making sure your IC works when you buy it: Integrated Circuit Testing and the International Test Conference Testing integrated circuits and systems for defects has never been trivial. Exhaustive testing is impossible, and test economics require testing to be fast and effective. This talk will discuss some of the work that engineers have done over the years to help minimize test escapes and reduce the odds that customers end up with defective devices. It will then cover some of the issues at the cutting edge of test today, and why they get so much attention at the International Test Conference. Speaker(s): Jennifer Dworak Agenda: WEBINAR: 7:00 – 8:00 P.M. The Zoom Webinar link and password will be forwarded to all registered participants after Noon on the day of the meeting. Check your spam folder if you don’t see the email. Webinar is open to all. PDH certificates are available and an evaluation form will be emailed to you after the meeting. PDH certificate are sent by IEEE USA 3-4 weeks after the meeting. Virtual: https://events.vtools.ieee.org/m/453863